Pan Jun-ye, Kang Bao-wei. A Criterion for Base Punch-Through in Bipolar Transis for Design[J]. Journal of Beijing University of Technology, 1983, 9(2): 105-111.
    Citation: Pan Jun-ye, Kang Bao-wei. A Criterion for Base Punch-Through in Bipolar Transis for Design[J]. Journal of Beijing University of Technology, 1983, 9(2): 105-111.

    A Criterion for Base Punch-Through in Bipolar Transis for Design

    • A theoretical analysis of base punchthrough problem of transistors is presented. A general formula of punch-through voltage for transistors with arbitrary doping profile is derived. Particularly, a crterion for base punch-through not to occur before collector junction avalanche breakdown is obtained. This result, which has been confirmed experimelally, can be used as a principle in bipolar transistor design.
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