Bai Tong-yun. The Application of Superconducting Quantum Interference Devices for RF Metrology[J]. Journal of Beijing University of Technology, 1980, 6(1): 76-88.
    Citation: Bai Tong-yun. The Application of Superconducting Quantum Interference Devices for RF Metrology[J]. Journal of Beijing University of Technology, 1980, 6(1): 76-88.

    The Application of Superconducting Quantum Interference Devices for RF Metrology

    • The fundamental theory of superconducting quantum interference devices and its principle of application for RF metrology, error and amendment is descrifed. Then, a method to realize the RF metrology is developed in this paper. It is a reflective method. The amplitude and phase will fe detected and indicated simultaneocosly The result will fe oftained from automatic-readout system.
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