DA Xiao-li, SHEN Guang-di, LIU Jian-ping, NIU Nan-hui, ZHU Yan-xu, LIANG Ting, ZOU De-shu, GUO Xia. Influence of Plasma Treatment on Performances of the GaN-based Light-emitting Diodes[J]. Journal of Beijing University of Technology, 2008, 34(7): 682-687.
    Citation: DA Xiao-li, SHEN Guang-di, LIU Jian-ping, NIU Nan-hui, ZHU Yan-xu, LIANG Ting, ZOU De-shu, GUO Xia. Influence of Plasma Treatment on Performances of the GaN-based Light-emitting Diodes[J]. Journal of Beijing University of Technology, 2008, 34(7): 682-687.

    Influence of Plasma Treatment on Performances of the GaN-based Light-emitting Diodes

    • The authors investigated the effects of plasma treatment on ICP etch damage.The GaN-based LED was put in PECVD chamber at different temperature and treated by N2,N2O and NH3 plasma under different RF power.It is observed that,in the case of 100℃and 20 W RF power,the optical and electrical characteristics of GaN-LEDs were improved after the N2O plasma treatment,the optical and electrical characteristics of GaN-LEDs were improved slightly after the N2 plasma treatment,while that of the GaN-LEDs were significantly degraded after the NH3 plasma treatment.
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