Two Dimension Numerical Analysis of Semiconductor Devices
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Graphical Abstract
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Abstract
A new two dimensional numerical analysis program SDA-1 is presented for semiconductor devices.It is applicable to two dimensional finite element numerical analysis of bipolar transistors and MOSFET. The adoptation of sparse matrix technique for Symbol LU decomposition, self-adaptive refinement technique for finite element meshes, and modified non-linear iterative technique, speeds up the device analysis cons-iderably.
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