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Wang Yousheng. Defect Signal Analysis Based on Magnetic Flux Leakage[J]. Journal of Beijing University of Technology, 1999, 25(3): 25-30.
Citation: Wang Yousheng. Defect Signal Analysis Based on Magnetic Flux Leakage[J]. Journal of Beijing University of Technology, 1999, 25(3): 25-30.
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Defect Signal Analysis Based on Magnetic Flux Leakage

  • Signal and Information Processing Laboratory, Beijing Polytechnic University, Beijing, 100022

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  • Received Date: March 14, 1999
  • Available Online: August 08, 2022
  • Published Date: September 09, 1999
    Graphical Abstract
    • Abstract
  • Testing technique based on magnetic flux leakage (MFL) is used to realize the fully automatic detecting of workpiece with high speed and high efficiency. The quantitative adjudgement can be made through the MFL analysis, which makes the corresponding processing, for defected workpiece, more rationalized and raises the utilization ratio as well.
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