Wang Yousheng. Defect Signal Analysis Based on Magnetic Flux Leakage[J]. Journal of Beijing University of Technology, 1999, 25(3): 25-30.
    Citation: Wang Yousheng. Defect Signal Analysis Based on Magnetic Flux Leakage[J]. Journal of Beijing University of Technology, 1999, 25(3): 25-30.

    Defect Signal Analysis Based on Magnetic Flux Leakage

    • Testing technique based on magnetic flux leakage (MFL) is used to realize the fully automatic detecting of workpiece with high speed and high efficiency. The quantitative adjudgement can be made through the MFL analysis, which makes the corresponding processing, for defected workpiece, more rationalized and raises the utilization ratio as well.
    • loading

    Catalog

      Turn off MathJax
      Article Contents

      /

      DownLoad:  Full-Size Img  PowerPoint
      Return
      Return