• 综合性科技类中文核心期刊
    • 中国科技论文统计源期刊
    • 中国科学引文数据库来源期刊
    • 中国学术期刊文摘数据库（核心版）来源期刊
    • 中国学术期刊综合评价数据库来源期刊
Advance Search
CHEN Jian-xin, HE Wei-li, GUO Wei-ling, GAO Wei, SHI Chen, CHEN Xi, ZHOU Dan, ZHENG Xin. Electric Current Stress Reliability Test of High-power White LED[J]. Journal of Beijing University of Technology, 2009, 35(3): 297-300.
Citation: CHEN Jian-xin, HE Wei-li, GUO Wei-ling, GAO Wei, SHI Chen, CHEN Xi, ZHOU Dan, ZHENG Xin. Electric Current Stress Reliability Test of High-power White LED[J]. Journal of Beijing University of Technology, 2009, 35(3): 297-300.
shu

Electric Current Stress Reliability Test of High-power White LED

  • College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China

More Information
  • Received Date: June 14, 2007
  • Available Online: December 06, 2022
    Graphical Abstract
    • Abstract
  • In order to conduct the reliability test of LEDs,experiments,which the electric current was token as the stress,were carried on 3 groups of 1 W and 3 W white-light LEDs respectively.The experiment results show that the main factors which influence the reliability of the high-power LEDs,are temperature of junction and phosphor powder invalidation.In the process of slow invalidation,the luminous flux rate declined between 15%and 20%,and the phenomenon of“the catalysis enhance”occurred at the beginning of the process.To reduce resistance from the p-n junction to the environment and to improve the material growth technology can more effectively reduce the risk of non-radiation and improve luminous efficiency.
    • FullText(HTML)
    • References (8)
  • [1]
    方言.LED市场分析及未来发展趋势[J].激光与光电子学进展,2007,44(6):69-71. FANG Yan.Market analysis and future trends of LED[J].Laser & Optoelectronics Progress,2007,44(6):69-71. (in Chinese)
    [2]
    方志烈.发光二极管材料与器件的历史、现状和展望[J].物理,2003,32(5):16-22. FANG Zhi-lie.Future applications of light emitting diodes[J].Physics,2003,32(5):16-22.(in Chinese)
    [3]
    李炳乾,布良基,范广涵,等.芯片键合材料对功率型LED热阻的影响[J].半导体光电,2003,24(6):422-424. LI Bing-qian,BU Liang-ji,FAN Guang-han,et al.Effect of die bonding materials on thermal resistance of power LED[J]. Semiconductor Optoelectronics,2003,24(6):422-424.(in Chinese)
    [4]
    郑代顺,钱可元,罗毅.大功率发光二极管的寿命试验及其失效分析[J].半导体光电,2005,26(2):87-91. ZHENG Dai-shun,QIAN Ke-yuan,LUO Yi.Life test and failure mechanism analyses for high-power LED[J]. Semiconductor Optoelectronics,2005,26(2):87-91.(in Chinese)
    [5]
    DANIEL L,BARTON D,MAREK O,et al.Life tests and failure analysis of A1GaN/InGaN/GaN blue light emitting diodes[C]//Physics and Simulation of Optoelectronic DevicesⅣ.Bellingham:SPIE,1996:64-72.
    [6]
    BARTON D,ZELLER J,PHILIPS B,et al.Degradation of blue AlGaN/InGaN/GaN LED subjected to high current pulse [C]//Reliability Physics Symposium.LasVegas:SPIE,1995:191-199.
    [7]
    MENEGESO G,LEVADA S,PIEROBON R,et al.Reliability analysis of GaN-based LED for solid state illumination[J]. IEICE Trans Electron,2003,E86-C(10):2032-2038.
    [8]
    TAKESHI Y.Estimation of the degradation of InGaN/AlGaN blue light emitting diodes[J].Microelectronics and Reliability,1997,37(8):1239-1241.
    • Related Articles

  • Related Articles

    [1]YU Hai, YANG Lei, GAO Yang, LIU Fengqi, LIU Pengyu, SUN Xuan, ZHANG Yue. Compressed Video Quality Enhancement Method Based on Block Coding Features[J]. Journal of Beijing University of Technology, 2024, 50(9): 1069-1076. DOI: 10.11936/bjutxb2022080003
    [2]WANG Yueshuai, HUANG Guoyu, SHEN Zhitong, LU Yue, SUI Manling. Application of Electrochemical and Photochemical Liquid-environment Transmission Electron Microscopy in the Field of Energy Catalysis[J]. Journal of Beijing University of Technology, 2023, 49(10): 1126-1140. DOI: 10.11936/bjutxb2022050010
    [3]LIU Jia, QI Hongyi, DOU Xiaona, LU Shaojie, LI Ping, LI Jian. Performance and Enhanced Degradation of Styrene in a Horizontal Bio-trickling Filter[J]. Journal of Beijing University of Technology, 2023, 49(8): 916-925. DOI: 10.11936/bjutxb2021110022
    [4]LIANG Wen-jun, WANG Ai-hua, FAN Xing, SUN Han-lin, LI Jian, HE Hong. Removal of Toluene by Non-thermal Plasma Coupled With V-Ti Catalysis[J]. Journal of Beijing University of Technology, 2015, 41(4): 628-635. DOI: 10.11936/bjutxb2014070022
    [5]DIAO Yan-hua, WANG Shun, GUO Lei, LIU Yan, ZHAO Yao-hua. Effect of Electric Field on the Enhanced Heat Transfer Characteristics of An Evaporator With Rectangular Micro-channels[J]. Journal of Beijing University of Technology, 2014, 40(11): 1707-1711.
    [6]ZHU Tao, LI Jian, HE Xu-wen, XU Dong-yao, SHU Xin-qian, LIANG Wen-jun, JIN Yu-quan. VOCs Removal Using Non-thermal Plasma Coupled With Catalysis[J]. Journal of Beijing University of Technology, 2011, 37(10): 1536-1542.
    [7]LU Yuan-wei, LI Wen-cai, SHENG Jian-ping, WANG Wei, MA Chong-fang. Enhancement of Photocatalytic Reaction Rate of HCHO Under the Action of Mass Transfer[J]. Journal of Beijing University of Technology, 2007, 33(8): 858-863.
    [8]WANG Dao, YE Qing, XIA Ding-guo, BA Te-er, ZHOU Ke-bin, FU Jin-hong. Research on Oxidation Activity of Ln2O3/γ-MnO2 Serial Catalyst[J]. Journal of Beijing University of Technology, 2002, 28(2): 160-162.
    [9]Tan Jianjun, Sun Li, Zhou Qiaolong, Sang Tian, Dai Qianhuan. Synthesis of Carbocyclic-1,1-Dicarboxylic Acids by Phase Transfer Catalysis[J]. Journal of Beijing University of Technology, 1998, 24(1): 97-99.
    [10]Li Zhiguo, Cheng Yaohai, Sun Yinghua, Guo Weiling, Li Xuexin, Li Zhiyong, Dai Cizhuang. The Analysis of Bipolar Transistor hFE Feilure Under Low Temperature and Its Reliability in Application[J]. Journal of Beijing University of Technology, 1996, 22(4): 25-30.

Catalog

    Get Citation
    PDF
    XML
    Article views (7) PDF downloads (8) Cited by()
    Turn off MathJax
    Article Contents
    Abstract
    References
    Related Articles

    Copyright © Editorial Department of Journal of Beijing University of Technology京公安备11019343018-20001

    Address：No.100 Pingleyuan, Chaoyang District, Beijing 100124,ChinaE-mail：xuebao_bjut@vip.163.com

    Supported by: Beijing Renhe Information Technology Co., Ltd.  Baidu Analytics

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return