CHEN Jian-xin, HE Wei-li, GUO Wei-ling, GAO Wei, SHI Chen, CHEN Xi, ZHOU Dan, ZHENG Xin. Electric Current Stress Reliability Test of High-power White LED[J]. Journal of Beijing University of Technology, 2009, 35(3): 297-300.
    Citation: CHEN Jian-xin, HE Wei-li, GUO Wei-ling, GAO Wei, SHI Chen, CHEN Xi, ZHOU Dan, ZHENG Xin. Electric Current Stress Reliability Test of High-power White LED[J]. Journal of Beijing University of Technology, 2009, 35(3): 297-300.

    Electric Current Stress Reliability Test of High-power White LED

    • In order to conduct the reliability test of LEDs,experiments,which the electric current was token as the stress,were carried on 3 groups of 1 W and 3 W white-light LEDs respectively.The experiment results show that the main factors which influence the reliability of the high-power LEDs,are temperature of junction and phosphor powder invalidation.In the process of slow invalidation,the luminous flux rate declined between 15%and 20%,and the phenomenon of“the catalysis enhance”occurred at the beginning of the process.To reduce resistance from the p-n junction to the environment and to improve the material growth technology can more effectively reduce the risk of non-radiation and improve luminous efficiency.
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