王亲猛, 刘赵淼, 罗木昌. 单晶硅化学气相沉积反应器流场初探[J]. 北京工业大学学报, 2001, 27(4): 483-485.
    引用本文: 王亲猛, 刘赵淼, 罗木昌. 单晶硅化学气相沉积反应器流场初探[J]. 北京工业大学学报, 2001, 27(4): 483-485.
    WANG Qin-meng, LIU Zhao-miao, LUO Mu-chang. Elementary Analysis on the Flow in Single-Wafer Silicon CVD Reactor[J]. Journal of Beijing University of Technology, 2001, 27(4): 483-485.
    Citation: WANG Qin-meng, LIU Zhao-miao, LUO Mu-chang. Elementary Analysis on the Flow in Single-Wafer Silicon CVD Reactor[J]. Journal of Beijing University of Technology, 2001, 27(4): 483-485.

    单晶硅化学气相沉积反应器流场初探

    Elementary Analysis on the Flow in Single-Wafer Silicon CVD Reactor

    • 摘要: 对单晶硅化学气相沉积(CVD)反应器在沉积过程中的流场进行了初步分析.通过数值求解三维层流 Navier-Stokes方程,研究了反应器内浮力效应所引起的流场对称性破坏.结果表明,由于存在浮力效应,轴对称 几何体中也会发生非轴对称流场分布,从而影响单晶硅的均匀生长.

       

      Abstract: Flow pattern in single-wafer silicon CVD reactors during the process of vapour deposition is tentatively studied through the numerical solution of the 3-D laminar Navier-Stokes equations. The research indicates that Non-axisymmetric flows may occur in the axi-symmetric solid owing to buoyancy effects alone.

       

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