陈建新, 贺卫利, 郭伟玲, 高伟, 史辰, 陈曦, 周丹, 郑昕. 大功率白光LED电流应力可靠性测试[J]. 北京工业大学学报, 2009, 35(3): 297-300.
    引用本文: 陈建新, 贺卫利, 郭伟玲, 高伟, 史辰, 陈曦, 周丹, 郑昕. 大功率白光LED电流应力可靠性测试[J]. 北京工业大学学报, 2009, 35(3): 297-300.
    CHEN Jian-xin, HE Wei-li, GUO Wei-ling, GAO Wei, SHI Chen, CHEN Xi, ZHOU Dan, ZHENG Xin. Electric Current Stress Reliability Test of High-power White LED[J]. Journal of Beijing University of Technology, 2009, 35(3): 297-300.
    Citation: CHEN Jian-xin, HE Wei-li, GUO Wei-ling, GAO Wei, SHI Chen, CHEN Xi, ZHOU Dan, ZHENG Xin. Electric Current Stress Reliability Test of High-power White LED[J]. Journal of Beijing University of Technology, 2009, 35(3): 297-300.

    大功率白光LED电流应力可靠性测试

    Electric Current Stress Reliability Test of High-power White LED

    • 摘要: 为了测试大功率白光LED的可靠性,对1 W和3 W大功率白光LED进行各3组以电流为应力的可靠性试验.试验结果表明:影响大功率白光LED可靠性的主要因素为结温和荧光粉失效;大功率白光LED缓变失效过程中,光通量下降的幅度为15%~20%;试验开始阶段存在“催化升高”现象;降低pn结到环境的热阻并且改进材料生长工艺,能有效地减少非辐射复合几率,提高发光效率.

       

      Abstract: In order to conduct the reliability test of LEDs,experiments,which the electric current was token as the stress,were carried on 3 groups of 1 W and 3 W white-light LEDs respectively.The experiment results show that the main factors which influence the reliability of the high-power LEDs,are temperature of junction and phosphor powder invalidation.In the process of slow invalidation,the luminous flux rate declined between 15%and 20%,and the phenomenon of“the catalysis enhance”occurred at the beginning of the process.To reduce resistance from the p-n junction to the environment and to improve the material growth technology can more effectively reduce the risk of non-radiation and improve luminous efficiency.

       

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