韩红桂, 甄晓玲, 李方昱, 杜永萍. 基于多尺度卷积神经网络的手机表面缺陷识别方法[J]. 北京工业大学学报, 2023, 49(11): 1150-1158. DOI: 10.11936/bjutxb2022010021
    引用本文: 韩红桂, 甄晓玲, 李方昱, 杜永萍. 基于多尺度卷积神经网络的手机表面缺陷识别方法[J]. 北京工业大学学报, 2023, 49(11): 1150-1158. DOI: 10.11936/bjutxb2022010021
    HAN Honggui, ZHEN Xiaoling, LI Fangyu, DU Yongping. Mobile Phone Surface Defects Recognition Method Based on Multi-scale Convolution Neural Networks[J]. Journal of Beijing University of Technology, 2023, 49(11): 1150-1158. DOI: 10.11936/bjutxb2022010021
    Citation: HAN Honggui, ZHEN Xiaoling, LI Fangyu, DU Yongping. Mobile Phone Surface Defects Recognition Method Based on Multi-scale Convolution Neural Networks[J]. Journal of Beijing University of Technology, 2023, 49(11): 1150-1158. DOI: 10.11936/bjutxb2022010021

    基于多尺度卷积神经网络的手机表面缺陷识别方法

    Mobile Phone Surface Defects Recognition Method Based on Multi-scale Convolution Neural Networks

    • 摘要: 针对手机表面缺陷难以精确识别的问题, 提出一种兼具Soble算子、逻辑损失函数(logistic loss function, LLF)和多尺度卷积神经网络(multi-scale convolutional neural networks, MSCNN)手机表面缺陷识别方法SL-MSCNN。首先, 构建了一种基于Sobel算子的邻域特征增强方法, 排除了图像中光照、阴影等无关因素的干扰; 其次, 设计了一种基于MSCNN的缺陷识别方法, 通过获得手机表面图像的多尺度信息, 提高了手机表面缺陷的识别精度, 同时, 引入了LLF, 通过降低梯度消失发生的概率加快训练的检测速度。实验结果表明: 与其他手机表面缺陷识别方法相比, SL-MSCNN在准确率和效率方面具有更好的使用价值。

       

      Abstract: To address the problem that mobile phone surface defects are difficult to be identified accurately, an approach for mobile surface defects recognition called SL-MSCNN was proposed, which combined the Sobel operator, logistic loss function (LLF) and multi-scale convolutional neural networks (MSCNN). First, a neighborhood feature enhancement method based on Sobel was constructed, which can exclude the interference of unrelated factors of image, such as lighting and shadow. Second, a defect recognition method based on MSCNN was designed, which can improve the recognition accuracy of mobile phone surface by obtaining multi-scale information of mobile phone surface image. Meanwhile, LLF was introduced, which speeded up the detection speed of training by reducing the probability of gradient disappearance. Results show that the proposed defect recognition method, compared with other methods, can improve the practicability of the actual process in terms of recognition accuracy and efficiency.

       

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