Abstract: A set of feasible solution to testing ELAB 2451 40 MHz, 10 bit analog-to-digital converter static parameters applied to base band chip for 802.11 g WLAN, which belongs to Beijing Embedded System Key Lab, is provided by this paper. Firstly and theoretically, the principle of code density histogram testing is interpreted. Secondly, a more robust accumulated code density testing method, independent of input sine wave signal magnitude variations, is offered and utilized to serve as a solution. Finally, validity and accuracy of this scheme are verified by testing AD 9218 from Analog Device, Inc. The results satisfy all parameter requirements.