双极晶体管<i>h</i><sub>FE</sub>低温失效分析及使用可靠性

双极晶体管h_FE低温失效分析及使用可靠性

摘要: 论述了影响双极晶体管电流增益h_FE低温下降的重掺杂效应,结合具体器件测试并计算出了h_FE的低温下降值,对实测值与计算值的差异进行了分析。最后指出了改进h_FE温度特性的具体途径。

Abstract: The effect of heavy doping on common emitter direct-current foreward currentgain(h_FE) of bipolar transistor was investigated. h_FE under low temperature was measured and calculated. And the difference between the h_FE measured and the calculated were analysed. The method to improve h_FE temperature dependences is pointed out based on the above work.